Devices
Research Topics and Expertise | Laboratories and Equipment |
Research Topics and Expertise
Electronics
Spin transport in 2D electron gas structures
Sci. Rep. 6 (2016) 22901(1) - 22901(8) https://www.nature.com/articles/srep22901
Equipment used: XXXX, XXXX, XXXX (LNSM)
Mode of user access: Proposal based full service, Internal project
Electric-field tuning of THz radiation

J. Phys. D-Appl. Phys. 51 (2018) 054001(1) - 054001(5). https://iopscience.iop.org/article/10.1088/1361-6463/aaa315
Equipment used: XXXX, XXXX, XXXX (LNSM)
Mode of user access: Proposal based full service, Internal project
Graphene doping by electron beam
Nanoscale 10, (2018), 17520. https://doi.org/10.1039/C8NR06483K
Equipment used: ALD, DIENER, DWL, EVAPORATOR (CEITEC Nano)
Mode of user access: Self service, (RG J. Čechal, CEITEC)
Optoelectronics
Diamond Photonic Crystals
ACS Nano 11 (2017) 2972 - 2981 https://pubs.acs.org/doi/10.1021/acsnano.6b08412
Equipment used: XXXX, XXXX, XXXX (LNSM)
Mode of user access: Proposal based full service, Internal project
Spintronics
Ultra-fast Antiferromagnetic Memories

Science Advances 4 (2018) eaar3566(1) https://advances.sciencemag.org/content/4/3/eaar3566
Equipment used: XXXX, XXXX, XXXX (LNSM, RG T. Jungwirth)
Mode of user access: Proposal based full service, Internal project
Electrical switching of antiferromagnet

Science 351 (2016) 587 - 590 https://science.sciencemag.org/content/351/6273/587.abstract
Equipment used: XXXX, XXXX, XXXX (LNSM, RG T. Jungwirth)
Mode of user access: Proposal based full service, Internal project
Reversal and detection of Néel vector in antiferromagnet

Nat. Commun. 9 (2018) 4686(1) - 4686(8) https://www.nature.com/articles/s41467-018-07092-2
Equipment used: XXXX, XXXX, XXXX (LNSM, RG T. Jungwirth)
Mode of user access: Proposal based full service, Internal project
ICT
Antiferromagnetic memory with microelectronic compatibility

Nat. Commun. 8 (2017) 15434(1) - 15434(7) https://www.nature.com/articles/ncomms15434
Equipment used: XXXX, XXXX, XXXX (LNSM, RG T. Jungwirth)
Mode of user access: Proposal based full service, Internal project
Memristive memories

Adv. Funct. Mater. 2017, 27, 1700384. http://dx.doi.org/10.1002/adfm.201700384
Equipment used: ALD, EVAPORATOR, DWL (CEITEC Nano)
Mode of user access: Academic full service (RG M. Lanza, Soochow University, China)
Sensors/transducers
Electrical detection of magnetization reversal
Phys. Rev. B 91 (2015) 180402(R)(1) - 180402(R)(5) https://journals.aps.org/prb/abstract/10.1103/PhysRevB.91.180402
Equipment used: XXXX, XXXX, XXXX (LNSM, RG T. Jungwirth)
Mode of user access: Proposal based full service, Internal project
Selectively arranged single-wire based nanosensor array systems for gas monitoring

Nanoscale 2018, 10, 9087. http://dx.doi.org/10.1039/C8NR01588K
Equipment used: RAITH, DWL, KAUFMAN, MAGNETRON, SCIA, RIE-FLUORINE, WIRE-BONDER, RIGAKU3
Mode of user access: Self service (RG J. Hubálek)
Gravimetrical sensors
MEMS
Equipment used: XXXX, XXXX, XXXX (CEITEC)
Mode of user access: Self service (RG J. Hubálek, CEITEC)
Gas/humidity sensors
Electrical - Graphene FET

Nanotechnology 28 (2017) 415203, https://doi.org/10.1088/1361-6528/aa86a4
Equipment used: MIRA3, DWL, EVAPORATOR (CEITEC)
Mode of user access: Self-service (RG J. T. Šikola, CEITEC)
Nanowire-based chemoresistive receptor
Nanoscale 10 (2018), 9087-9096, https://doi.org/10.1039/c8nr01588k
Equipment used: EBL Raith150, DWL, Magnetron sputtering, Ion beam sputtering, RIE, IBE SCIA system, AACVD, XRD, XPS, SEM, (CEITEC)
Mode of user access: Self service (RG J. Hubálek, CEITEC)
Hexagonal rod-based nanostructures for gas sensing
Sensors and Actuators B 268 (2018) 15–21, https://doi.org/10.1016/j.snb.2018.04.033
Equipment used: AACVD, XRD, XPS, HRTEM, (CEITEC)
Mode of user access: Self service (RG J. Hubálek, CEITEC)
Cryo micro-manipulators
MEMS

Equipment used: DWL, DRIE (CEITEC)
Mode of user access: Self service, Contractual research (RG J. T. Šikola, CEITEC)
Microfluidics
Channels in silicon technology
Buried channels
Microfluidics and Nanofluidics 22 (2018) 105, https://doi.org/10.1007/s10404-018-2125-6
Equipment used: DWL, MA8, RCD8, DRIE, DIENER, PARYLENE (CEITEC)
Mode of user access: Self service (RG J. Hubálek, CEITEC)
Biosensors
Immunosensors
Electrochemical
Equipment used: XXXX, XXXX, XXXX (CEITEC)
Mode of user access: Self service (RG J. Hubálek, CEITEC)
Enzyme-based sensors
Electrochemical
Equipment used: XXXX, XXXX, XXXX (CEITEC)
Mode of user access: Self service (RG J. Hubálek, CEITEC)
Optical biosensors
Photonic - (Integrated IR cascade laser)
Equipment used: XXXX, XXXX, XXXX (CEITEC)
Mode of user access: Self service (RG H. Detz, CEITEC)
Sensors based on CuO/ZnO NPs
Photonic - Optical (Mie's resonances)

Colloids Surf B Biointerfaces, 2014 Nov 1;123:951-8.
https://doi.org/10.1016/j.colsurfb.2014.10.051
Equipment used: LYRA, RIGAKU 3, JAZ3-CHANNEL (CEITEC)
Mode of user access: Self-service (RG T. Šikola, CEITEC)
The platform for nanopore membrane sensing
Plasmonic device

Microelectronic Engineering, Volume 228, 1 May 2020, 111326, https://doi.org/10.1016/j.mee.2020.111326
Equipment used: MIRA3, RAITH, RIE-FLUORINE, RIE-CHLORINE EVAPORATOR(CEITEC)
Mode of user access: Self-service (RG T. Šikola, CEITEC)
Energy harvesting
Solar cells on patterned structures
phys. status solidi a 212 (2015) 1823 - 1829 https://onlinelibrary.wiley.com/doi/full/10.1002/pssa.201431869
Equipment used: XXXX, XXXX, XXXX (LNSM)
Mode of user access: Self service (RG M. Vaněček, LNSM)
Piezo-resonant based devices
MEMS
Equipment used: XXXX, XXXX, XXXX (CEITEC)
Mode of user access: Self service (RG J. Hubálek, CEITEC)
Integrated planar optics
Diffraction optics
Metasurfaces

Contractual research
Equipment used: RAITH, DRIE, SCIA, RIE-FLUORINE, RIE-CHLORINE, PECVD, ALD, EVAPORATOR (CEITEC)
Mode of user access: Self service (RG T. Šikola, CEITEC)
Beam-phase-profile forming lenses
Metasurfaces

ACS Photonics 2017, 4, 1389., http://dx.doi.org/10.1021/acsphotonics.7b00022
Equipment used: MIRA, LYRA, EVAPORATOR (CEITEC)
Mode of user access: Self service (RG T. Šikola, CEITEC)
Laboratories and Equipment
Lithography
E-beam writer RAITH150 Two (RAITH)
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Methods: sub-10 nm e-beam lithography
Location: CEITEC
Guarantor: Meena Dhankhar
Modes of access: Paid full service, Proposal full service, Self-service
Electron beam writer Raith eLine (RAITHELINE)

Methods: Electron lithography
Location: LNSM
Guarantor: Kamil Olejník
Modes of access: Free full-service
SEM/Electron beam writer Tescan Mira3/Raith LIS (MIRA)
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Methods: sub-50 nm e-beam lithography
Location: CEITEC
Guarantor: Vojtěch Švarc
Modes of access: Paid full service, Proposal full service, Self-service
Focused Ion Beam/Scanning Electron Microscope TESCAN LYRA3 (LYRA)
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Methods: sub 10-nm focused ion beam milling/irradiation, FEBID, FIBID, basic electron beam lithography
Location: CEITEC
Guarantor: Tomáš Šamořil
Modes of access: Paid full service, Proposal full service, Self-service
UV Direct Write Laser system HEIDELBERG DWL 66-fs (DWL)
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Methods: sub 2-micrometer laser scanning lithography, maskmaking
Location: CEITEC
Guarantor: Erik Pálesch
Modes of access: Paid full service, Proposal full service, Self-service
Optical mask aligner unit (MASKALIGNER)

Methods: Optical lithography, UV lithography, contact
Location: LNSM
Guarantor: Kamil Olejník
Modes of access: Free full-service
Mask Aligner SÜSS MicroTec MA8 (SUSS-MA8)
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Methods: soft, hard, proximity UV lithography, nanoimprint lithography
Location: CEITEC
Guarantor: Vojtěch Švarc
Modes of access: Paid full service, Proposal full service, Self-service
Ellipsometer SpecEl - 2000-UV/VIS/NIR (ELLIPS-SPECEL)

Methods: Ellipsometry
Location: LNSM
Guarantor: Kamil Olejník
Modes of access: Free full-service
Cryostat ARS CS202PI-DMX-3 (CRYO-ARS)
Methods: Temperature dependences
Location: LNSM
Guarantor: Kamil Olejník
Modes of access: Free full-service
Electromagnet GMW 3472-70 (ELM-3472-70)

Methods: Magnetotransport
Location: LNSM
Guarantor: Kamil Olejník
Modes of access: Free full-service
Parametric Device Analyzer Agilent B1500A (DEVANAGILENT)

Methods: Electrical characterisation
Location: LNSM
Guarantor: Kamil Olejník
Modes of access: Free full-service
Network Analyzer Rohde&Schwarz ZVA50 (NARS-ZVA50)

Methods: Ferromagnetic resonance
Location: LNSM
Guarantor: Kamil Olejník
Modes of access: Free full-service
Oscilloscope Rohde&Schwarz RTP064 (OSCILLRSRTP064)

Methods: Ultrashort electrical pulse experiments
Location: LNSM
Guarantor: Kamil Olejník
Modes of access: Free full-service
Subnanosecond pulse generator Kentech Instruments RTV30 (SUB-NSPULSERRTV30)
Methods: Ultrashort electrical pulse experiments
Location: LNSM
Guarantor: Kamil Olejník
Modes of access: Free full-service
Photolithographic system (FOSY)
Methods: Optical photolithography
Location: LNSM
Guarantor: Stěpán Stehlík
Modes of access: Full-service
Spin Coater
Methods:
Location: LNSM
Guarantor: ????
Modes of access: Self-service
Resist coating and development system SÜSS MicroTec RCD8 (SUSS-RCD8)
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Methods: semi-automated spin coating and resist development
Location: CEITEC
Guarantor: Radim Hrdý
Modes of access: Paid full service, Proposal full service, Self-service
Lithographic wetbench for coating (SUSS-WETBENCH)
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Methods: manual spin coating, two hotplates, vapor primer (HDMS)
Location: CEITEC
Guarantor: Erik Pálesch
Modes of access: Paid full service, Proposal full service, Self-service
Spincoater Laurell WS-650-23B (LAURELL)
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Methods: manual spin coating
Location: CEITEC
Guarantor: Vojtěch Švarc
Modes of access: Paid full service, Proposal full service, Self-service
Resist stripper Diener NANO Plasma cleaner (DIENER)
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Plasma Diener
Methods:
Location: LNSM
Guarantor: ????
Modes of access: Self-service
Critical Point Dryer – Tousimis Autosamdri-815B (CPD-Autosamdri-815D)
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Methods: Critical point drying for wafer and MEMS
Location: CEITEC
Guarantor: Jiří Zita
Modes of access: Paid full service, Proposal full service, Self-service
Veeco Dektak Profiler (DEKTAK150)
Methods: Surface topography profiling
Location: LNSM
Guarantor: Kamil Olejník
Modes of access: Free full-service
Mechanical profilometer Bruker Dektak XT (DEKTAK)
Methods: thin film and step height measurement
Location: CEITEC
Guarantor: Meena Dhankhar
Modes of access: Paid full service, Proposal full service, Self-service
Spectroscopic reflectometer Ocean Optics NanoCalc 2000 (NANOCALC)
Methods: Resist thickness measurement mainly. Film thickness from 10 nm up to 100 µm.
Location: CEITEC
Guarantor: Vojtěch Švarc
Modes of access: Paid full service, Proposal full service, Self-service
Optical microscope Zeiss Axio Imager A2 (ZEISS-A2)
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Etching and depositions
Deep reactive ion etching of Si-based materials, Oxford Instruments Plasma Technology PlasmaPro 100 (DRIE)
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Methods: Si DRIE
Location: CEITEC
Guarantor: Marek Eliáš
Modes of access: Paid full service, Proposal full service, Self-service
Ion beam etching Scia Systems Coat 200 (SCIA)
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Methods: Ion beam milling, SIMS endpoint detection
Location: CEITEC
Guarantor: Marek Eliáš
Modes of access: Paid full service, Proposal full service, Self-service
RIE by Fluorine Chemistry and PECVD of hard C-based films, Oxford PlasmaPro NGP 80 (RIE-FLUORINE)
Methods: etching of Si, SiO2, Si3N4, TiO2, Au, Nb and deposition of DLC and CN films
Location: CEITEC
Guarantor: Marek Eliáš
Modes of access: Paid full service, Proposal full service, Self-service
RIE by Chlorine Chemistry, Oxford Instruments Plasma Technology PlasmaPro 100 (RIE-CHLORINE)
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Methods: chlorine-based etching
Location: CEITEC
Guarantor: Marek Eliáš
Modes of access: Paid full service, Proposal full service, Self-service
Oxford Instruments Plasmalab 100 (RIEPL100)
Methods: Reactive plasma etching
Location: LNSM
Guarantor: Kamil Olejník
Modes of access: Self-service
XeF2 etching system (XeF2)
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Methods: Isotropic Si etching
Location: CEITEC
Guarantor: Jan Prášek
Modes of access: Paid full service, Proposal full service, Self-service
Magnetron sputtering system BESTEC (MAGNETRON)
Methods: Deposition of Ag, Al, Au, Bi, C, Co, Cr, Cu, Gd, Fe, Hf, Mo, Mn, Nb, Ni, Pt, Ru, Si, Sb, Sc, Ta, Ti, W, Zr, TiN, TiO2, AlCuSi, NiCr, Ni80Fe20, Ir20Mn80, Fe75Co25, Fe50Rh50, Al2O3, SiO2, Co20Fe60B20
Location: CEITEC
Guarantor: Jan Prášek
Modes of access: Paid full service, Proposal full service, Self-service
E lectron beam evaporator BESTEC (EVAPORATOR)
Methods: Evaporation of W, Ta, VO2, SiO2, Au, Ti, Cr, Co, Cu, Ni, Fe, Cr2O3, Ag, Al, NiFe, NiCr
Location: CEITEC
Guarantor: Jan Prášek
Modes of access: Paid full service, Proposal full service, Self-service
Ion-Beam Sputter Deposition System BESTEC (KAUFMAN)
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Methods: Ion beam assisted deposition of Ti, Al, W, Hf, Ta, Zr
Location: CEITEC
Guarantor: Imrich Gablech
Modes of access: Paid full service, Proposal full service, Self-service
Covap Deposition Chamber ()
Methods: ??
Location: LNSM ()
Guarantor:
Modes of access: Self-service
Atomic layer deposition system, Ultratech/CambridgeNanoTech Fiji 200 (ALD)
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Methods: La2O3, Al2O3, HfO2, TiO2, SiO2, TiN, AlN
Location: CEITEC
Guarantor: Marek Eliáš
Modes of access: Paid full service, Proposal full service, Self-service
High-temperature plasma-enhanced chemical vapour deposition system on C-based materials, Oxford Instruments Plasma Technology NanoFab (PECVD-NANOFAB)
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Methods: deposition of carbon nanotubes and graphene
Location: CEITEC
Guarantor: Marek Eliáš
Modes of access: Paid full service, Proposal full service, Self-service
Plasma Enhanced CVD of Si-based materials, Oxford Instruments Plasma Technology PlasmaPro 100 (PECVD)
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Methods: SiN and a-Si deposition
Location: CEITEC
Guarantor: Marek Eliáš
Modes of access: Paid full service, Proposal full service, Self-service
Atmospheric Pressure chemical vapor deposition (APCVD)
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Methods: SiO2 deposition
Location: CEITEC
Guarantor: Filip Munz
Modes of access: Paid full service, Proposal full service, Self-service
Low-Pressure chemical vapor deposition – amorphous Si (LPCVD-polySi)
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Methods: amorphous silicon deposition
Location: CEITEC
Guarantor: Filip Munz
Modes of access: Paid full service, Proposal full service, Self-service
Low-Pressure chemical vapor deposition – Si nitrides (LPCVD-SiN)
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Methods: SixNy deposition
Location: CEITEC
Guarantor: Filip Munz
Modes of access: Paid full service, Proposal full service, Self-service
Metal-organic chemical vapor deposition (MOCVD)
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Methods: TiO2, Fe2O3, BaTiO3, PbZrTiO3, HfO2
Location: CEITEC
Guarantor: Filip Munz
Modes of access: Paid full service, Proposal full service, Self-service
SCS Parylene Deposition System (PARYLENE)
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Methods: Application of SCS Parylene conformal coatings
Location: CEITEC
Guarantor: Jan Prášek
Modes of access: Paid full service, Proposal full service, Self-service
PCCE Flowboxes
2.2 - navrhuju spojit 2.2 chips a 2.3 PCB na 2.2 Chips & PCBs
Wire bonder K&S
2.4 DC/AC electrical testing Standard DC and AC characterisation tools (multimeters, lock-in amplifiers, …) Short pulse and high frequency equipment (RTV 30 sub-ns pulse generator, R&S RTP64 20GSa/s Oscilloscope, R&S ZVA 50GHZ Vector Network Analyzer
PCCE Flowboxes
2.2 - navrhuju spojit 2.2 chips a 2.3 PCB na 2.2 Chips & PCBs
Wire bonder K&S
2.4 DC/AC electrical testing Standard DC and AC characterisation tools (multimeters, lock-in amplifiers, …) Short pulse and high frequency equipment (RTV 30 sub-ns pulse generator, R&S RTP64 20GSa/s Oscilloscope, R&S ZVA 50GHZ Vector Network Analyzer)
Packaging
Wire bonder TPT HB 16 (WIRE-BONDER)
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Methods: wedge-wedge, ball-wedge, ribbon and bump bonding class
Location: CEITEC
Guarantor:
Marek Vaňatka
Modes of access: Paid full service, Proposal full service, Self-service
Laser dicer Oxford Lasers A-Series (LASER-DICER)
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Methods: Laser class 1
Location: CEITEC
Guarantor: Jakub Sadílek
Modes of access: Paid full service, Proposal full service, Self-service
Semiautomatic dicing saw ESEC 8003 (DICING-SAW)
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Methods:
Location: CEITEC
Guarantor: Radovan Klusák
Modes of access: Paid full service, Proposal full service
Testing
4-probe station Cascade Microtech MPS 150
(MPS150)
Methods:
Location: CEITEC
Guarantor:
Radim Hrdý
Modes of access:
Paid full service, Proposal full service, Self-service
Keithley 4200-SCS Parameter Analyzer
(KEITHLEY-4200)
Methods:
Location: CEITEC
Guarantor:
Radim Hrdý
Modes of access:
Paid full service, Proposal full service, Self-service
Semi-automated 4-probe system Cascade Microtech SUMMIT 12000
(SUMMIT)
Methods:
Location: CEITEC
Guarantor:
Radim Hrdý
Modes of access:
Paid full service, Proposal full service, Self-service
High-frequency MPI probe station for vector network analysis
(VNA-MPI)
Methods:
Location: CEITEC
Guarantor:
Michal Urbánek
Modes of access:
Paid full service, Proposal full service, Self-service


